Spectrometer

Based on the Multi-CCD detector and total spectrum technology, OES 8000 Optical Emission Spectrometer is able to detect all the spectral lines within the wavelength range. OES 8000 Optical Emission Spectrometer features a new design which eliminates the need of a vacuum pump and vacuum sealed chamber for accurate analysis. With extended wavelengh range the instrument is suitable for the complex analysis of ferrous and non-ferrous metals.

• High end Components- CARL ZEISS Grating and Optical lens, Toshiba CCD Detector & Agilent Optical Fiber
• Polychromator operates without need of vacuum pump
• High Resolution: 10 pm/pixel
• Fast analysis: 35 seconds testing
• Excellent reliability and repeatability- 24/7 operation
• Compact Size

• Metallurgy, steel, ferrous & non-ferrous metals
• R&D, process control, inspection and sorting.
• Metal smelting, metal casting and processing industry

EDX2800B X-Ray Fluorescence Spectrometer is specifically designed for RoHS analysis and quality control. Manufacturers seeking compliance with RoHS / WEEE directive can quickly and non-destructively screen their products for Hazardous substances and ensure the safety of their products.

• Specifically developed for RoHS testing: Lead (Pb), Mercury (Hg), Cadmium (Cd), Hexavalent Chromium and other hazardous elements
• Automatic collimators and filters
• Built-in SNE (Signal to Noise Enhancer)
• Intelligent RoHS analytical software
• Optional Plating-thickness analysis software
• Variable non-linear regression

• RoHS and Thickness measurement of metal plating
• Manufacturers who need to comply with RoHS Directive
• Electroplating industry

Product Details:

EDX3600H X-Ray Fluorescence Spectrometer is an all-in-one XRF capable of virtually any elemental application. EDX3600H comes standard with best in class UHRD/SDD detector and advanced vacuum system and can be used for multiple testing types including Mineral, Alloy, RoHS, Plating Thickness and custom applications.

• High-performance electronic cooling UHRD detector or Silicon Drift SDD Detector- Application specific
• Automatic collimators and filters
• Built-in SNE (Signal to Noise Enhancer)
• Intelligent RoHS analytical software
• Multiple Software options
• Advanced Vacuum System
• Excellent light elements identification- Al, Cl, Br

• Full-elemental analysis- Na-U
• RoHS/WEEE Analysis
• Mineral Analysis
• Alloy Analysis
• Plating Thickness
• Custom calibrations for virtually any application

Additional Information:

• Delivery Time: 4 WEEKS